Overcoming 5G mmWave Semiconductor Production Test Challenges

Beamformer integrated circuits are the key to unlocking the low latency and increased bandwidth performance promised by 5G networks, and they play a critical role in other applications areas as well including radar, imaging and remote sensing.
Test engineers face a new set of challenges as they transition these devices from the laboratory to a high-volume production environment. Increased operating frequencies (44 GHz is now commonplace with 53 GHz and beyond on the near horizon) impact virtually every aspect of the test system design and implementation.
Download this white paper to learn about the advantages of selecting a MOSA-based test system to achieve high throughput, without sacrificing measurement performance.

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